Enhanced performance and reliability for solid-phase crystallized poly-Si TFTs with argon ion implantation (vol 154, pg J375, 2007)
| dc.citation.epage | S4 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | S4 | en_US |
| dc.citation.volume | 155 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | Chang, Chia-Wen | en_US |
| dc.contributor.author | Deng, Chih-Kang | en_US |
| dc.contributor.author | Chang, Che-Lun | en_US |
| dc.contributor.author | Lei, Tan-Fu | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:12:56Z | |
| dc.date.available | 2014-12-08T15:12:56Z | |
| dc.date.issued | 2008 | en_US |
| dc.identifier.doi | 10.1149/1.2821307 | en_US |
| dc.identifier.issn | 0013-4651 | en_US |
| dc.identifier.journal | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1149/1.2821307 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/9979 | |
| dc.identifier.wosnumber | WOS:000251906800081 | |
| dc.language.iso | en_US | en_US |
| dc.title | Enhanced performance and reliability for solid-phase crystallized poly-Si TFTs with argon ion implantation (vol 154, pg J375, 2007) | en_US |
| dc.type | Correction | en_US |