Fabrication and X-ray absorption NaxCoO2 spectroscopy in layered cobaltate thin films

Abstract

NaxCoO2 (x similar to 0.68) thin films were fabricated on sapphire (0 0 0 1) substrates via the lateral diffusion of sodium into Co3O4 (1 1 1) films, which were grown by pulsed-laser deposition. From the results of X-ray diffraction and in-plane resistivity rho(ab), the single phase and the metallic behaviors of these NaxCoO2 films can be identified. For the same sodium content x, rho(ab) is consistent with that of single crystals. In addition, the O 1s X-ray absorption near edge spectra of thin films are measured and compared with those of single crystals. (c) 2006 Elsevier B.V. All rights reserved.