Fabrication and X-ray absorption NaxCoO2 spectroscopy in layered cobaltate thin films

標題:	Fabrication and X-ray absorption NaxCoO2 spectroscopy in layered cobaltate thin films
作者:	Chang, W. J. Lin, J.-Y. Chung, T. Y. Chen, J. M. Hsu, C.-H. Hsu, S. Y. Uen, T. M. Wu, K. H. Gou, Y. S. Juang, J. Y. 電子物理學系物理研究所 Department of Electrophysics Institute of Physics
關鍵字:	NaxCoO2 thin film;layered cobaltates;lateral diffusion;X-ray diffraction;X-ray absorption spectroscopy
公開日期:	1-三月-2007
摘要:	NaxCoO2 (x similar to 0.68) thin films were fabricated on sapphire (0 0 0 1) substrates via the lateral diffusion of sodium into Co3O4 (1 1 1) films, which were grown by pulsed-laser deposition. From the results of X-ray diffraction and in-plane resistivity rho(ab), the single phase and the metallic behaviors of these NaxCoO2 films can be identified. For the same sodium content x, rho(ab) is consistent with that of single crystals. In addition, the O 1s X-ray absorption near edge spectra of thin films are measured and compared with those of single crystals. (c) 2006 Elsevier B.V. All rights reserved.
URI:	http://dx.doi.org/10.1016/j.jmmm.2006.10.301 http://hdl.handle.net/11536/5168
ISSN:	0304-8853
DOI:	10.1016/j.jmmm.2006.10.301
期刊:	JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume:	310
Issue:	2
起始頁:	E335
結束頁:	E336
顯示於類別：	會議論文

文件中的檔案：

若為 zip 檔案，請下載檔案解壓縮後，用瀏覽器開啟資料夾中的 index.html 瀏覽全文。