Using a periodic square wave test-signal to detect crosstalk faults
| dc.citation.epage | 169 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 160 | en_US |
| dc.citation.volume | 22 | en_US |
| dc.citation.woscount | 12 | |
| dc.contributor.author | Wu, MS | en_US |
| dc.contributor.author | Lee, CL | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:19:38Z | |
| dc.date.available | 2014-12-08T15:19:38Z | |
| dc.date.issued | 2005-03-01 | en_US |
| dc.description.abstract | This BIST scheme simplifies the detection of crosstalk faults in deep-submicron VLSI circuits in the boundary scan environment. Simulation results show that with just a few random patterns fault coverage for. most large benchmark circuits can exceed 90%. | en_US |
| dc.identifier.doi | 10.1109/MDT.2005.49 | en_US |
| dc.identifier.issn | 0740-7475 | en_US |
| dc.identifier.journal | IEEE DESIGN & TEST OF COMPUTERS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/MDT.2005.49 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/13963 | |
| dc.identifier.wosnumber | WOS:000228102300009 | |
| dc.language.iso | en_US | en_US |
| dc.title | Using a periodic square wave test-signal to detect crosstalk faults | en_US |
| dc.type | Article | en_US |