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Bipolar switching characteristics of low-power Geo resistive memory

dc.citation.epage93en_US
dc.citation.issue1en_US
dc.citation.spage90en_US
dc.citation.volume62en_US
dc.citation.woscount1
dc.contributor.authorCheng, C. H.en_US
dc.contributor.authorChen, P. C.en_US
dc.contributor.authorLiu, S. L.en_US
dc.contributor.authorWu, T. L.en_US
dc.contributor.authorHsu, H. H.en_US
dc.contributor.authorChin, Alberten_US
dc.contributor.authorYeh, F. S.en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:29:30Z
dc.date.available2014-12-08T15:29:30Z
dc.date.issued2011-08-01en_US
dc.description.abstractWe reported an ultra low-power resistive random access memory (RRAM) combining a low-cost Ni electrode and covalent-bond GeO(x) dielectric. This cost-effective Ni/GeO(x)/TaN RRAM device has very small set power of 2 mu W, ultra-low reset power of 130 pW, greater than 1 order of magnitude resistance window, and stable retention at 85 degrees C. The current flow at low-resistance state is governed by Poole-Frenkel conduction with electrons hopping via defect traps, which is quite different from the filament conduction in metal-oxide RRAM. (C) 2011 Elsevier Ltd. All rights reserved.en_US
dc.identifier.doi10.1016/j.sse.2011.04.010en_US
dc.identifier.issn0038-1101en_US
dc.identifier.journalSOLID-STATE ELECTRONICSen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.sse.2011.04.010en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/21216
dc.identifier.wosnumberWOS:000292444000015
dc.language.isoen_USen_US
dc.subjectResistive random access memory (RRAM)en_US
dc.subjectGermanium oxide (GeO(2))en_US
dc.titleBipolar switching characteristics of low-power Geo resistive memoryen_US
dc.typeArticleen_US

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