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Experimental and theoretical analysis on ultraviolet 370 nm AlGaInN light-emitting diodes

dc.citation.epage603en_US
dc.citation.issue5en_US
dc.citation.spage598en_US
dc.citation.volume21en_US
dc.citation.woscount6
dc.contributor.authorChang, Yi-Anen_US
dc.contributor.authorYen, Sheng-Horngen_US
dc.contributor.authorWang, Te-Chungen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.authorKuo, Yen-Kuangen_US
dc.contributor.authorLu, Tien-Changen_US
dc.contributor.authorWang, Shing-Chungen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:16:47Z
dc.date.available2014-12-08T15:16:47Z
dc.date.issued2006-05-01en_US
dc.description.abstractAn ultraviolet (UV) AlGaInN light-emitting diode (LED) with 370 nm emission is demonstrated. At room temperature (RT) UV power of 0.8 mW at 20 mA with 3.6 V operation voltage is achieved. It provides 4 mW output when driven at 125 mA under continuous-wave (CW) operation. Qualitative optimization of the Al composition in the AlGaN electron-block layer and the quaternary AlGaInN quantum well (QW) number of the UV LED is also investigated in this study. The numerical results fit with the experimentally demonstrated output performance of our AlGaInN UV LED. We find that the UV AlGaInN LED can provide better output characteristics when the Al composition in the AlGaN electron-block layer is in the range 19-21 % and the AlGaInN QW number is in the range 5-7 by reducing the electron leakage current.en_US
dc.identifier.doi10.1088/0268-1242/21/5/005en_US
dc.identifier.issn0268-1242en_US
dc.identifier.journalSEMICONDUCTOR SCIENCE AND TECHNOLOGYen_US
dc.identifier.urihttp://dx.doi.org/10.1088/0268-1242/21/5/005en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/12349
dc.identifier.wosnumberWOS:000237885000007
dc.language.isoen_USen_US
dc.titleExperimental and theoretical analysis on ultraviolet 370 nm AlGaInN light-emitting diodesen_US
dc.typeArticleen_US

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