Impacts of a buffer layer and hi-wafers on the performance of strained-channel NMOSFETs with SiN capping layer
| dc.citation.epage | + | en_US |
| dc.citation.spage | 329 | en_US |
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Tsai, Tzu-, I | en_US |
| dc.contributor.author | Lee, Yao-Jen | en_US |
| dc.contributor.author | Chen, King-Sheng | en_US |
| dc.contributor.author | Wang, Jeff | en_US |
| dc.contributor.author | Wan, Chia-Chen | en_US |
| dc.contributor.author | Hsueh, Fu-Kuo | en_US |
| dc.contributor.author | Lin, Horng-Chih | en_US |
| dc.contributor.author | Chao, Tien-Sheng | en_US |
| dc.contributor.author | Huang, Tiao-Yuan | en_US |
| dc.contributor.department | 物理研究所 | zh_TW |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Institute of Physics | en_US |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2017-04-21T06:49:10Z | |
| dc.date.available | 2017-04-21T06:49:10Z | |
| dc.date.issued | 2007 | en_US |
| dc.identifier.isbn | 978-1-4244-1891-6 | en_US |
| dc.identifier.journal | 2007 INTERNATIONAL SEMICONDUCTOR DEVICE RESEARCH SYMPOSIUM, VOLS 1 AND 2 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/135142 | |
| dc.identifier.wosnumber | WOS:000255857100169 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Impacts of a buffer layer and hi-wafers on the performance of strained-channel NMOSFETs with SiN capping layer | en_US |
| dc.type | Proceedings Paper | en_US |
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