Skip to main content
Log In
Communities & Collections
All of DSpace
Statistics
Home
學術出版;;Publications
會議論文;;Conferences Paper
Study of low-temperature and post-stress hysteresis in high-k gate dielectrics
Study of low-temperature and post-stress hysteresis in high-k gate dielectrics
Loading...
Date
2007
Authors
Wu, You-Lin
Lin, Shi-Tin
Yang, Chang Cheng
Wu, Chien-Hung
Chin, Albert
Journal Title
Journal ISSN
Volume Title
Publisher
DOI
Abstract
Description
Keywords
Citation
URI
https://ir.lib.nycu.edu.tw/handle/11536/135140
Collections
會議論文;;Conferences Paper
Endorsement
Review
Supplemented By
Referenced By
Full item page
