Polarization modulation for fluorescence emission difference microscopy
| dc.citation.epage | 13712 | en_US |
| dc.citation.issue | 10 | en_US |
| dc.citation.spage | 13704 | en_US |
| dc.citation.volume | 23 | en_US |
| dc.citation.woscount | 6 | en_US |
| dc.contributor.author | Wang, Nan | en_US |
| dc.contributor.author | Kobayashi, Takayoshi | en_US |
| dc.contributor.department | 先進超快雷射研究中心 | zh_TW |
| dc.contributor.department | Adv Ultrafast Laser Ctr | en_US |
| dc.date.accessioned | 2019-04-03T06:38:33Z | |
| dc.date.available | 2019-04-03T06:38:33Z | |
| dc.date.issued | 2015-05-18 | en_US |
| dc.description.abstract | Effects of the polarization on subtracted images in fluorescence emission difference microscopy are numerically investigated based on vector beam diffraction theory and alteration of Jones matrices. Parameters of resolution, signal loss, and amplitude of negative sidebands after subtraction are discussed along with the polarization of excitation beams and sample sizes. The effects of polarization on the ellipticity and subtraction threshold are also given. (C) 2015 Optical Society of America | en_US |
| dc.identifier.doi | 10.1364/OE.23.013704 | en_US |
| dc.identifier.issn | 1094-4087 | en_US |
| dc.identifier.journal | OPTICS EXPRESS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1364/OE.23.013704 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/124808 | |
| dc.identifier.wosnumber | WOS:000354706800117 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Polarization modulation for fluorescence emission difference microscopy | en_US |
| dc.type | Article | en_US |