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Estimating and testing process accuracy with extension to asymmetric tolerances

dc.citation.epage995en_US
dc.citation.issue5en_US
dc.citation.spage985en_US
dc.citation.volume44en_US
dc.citation.woscount0
dc.contributor.authorWu, Chien-Weien_US
dc.contributor.authorShu, Ming-Hungen_US
dc.contributor.authorPearn, W. L.en_US
dc.contributor.authorTai, Yi-Changen_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.date.accessioned2014-12-08T15:48:38Z
dc.date.available2014-12-08T15:48:38Z
dc.date.issued2010-08-01en_US
dc.description.abstractPearn et al. (Commun. Stat. Theory Methods, 27(4):985-1000, 1998) introduced the process accuracy index C(a) to measure the degree of process centering, the ability to cluster around the center. In this paper, we derive an explicit form of the cumulative distribution function for the estimator (C) over cap (a) with the case of symmetric tolerances. Subsequently, the distributional and inferential properties of the estimated process accuracy index C(a) are provided. Calculations of the critical values, P-values, and lower confidence bounds are developed for testing process accuracy. Further, a generalization of C(a) for the case with asymmetric tolerances is proposed to measure the process accuracy. Based on the results practitioners can easily perform the testing of the process accuracy, and make reliable decisions on whether actions should be taken to improve the process quality. An application is given to illustrate how we test the process accuracy using the actual data collected from the factory.en_US
dc.identifier.doi10.1007/s11135-009-9243-xen_US
dc.identifier.issn0033-5177en_US
dc.identifier.journalQUALITY & QUANTITYen_US
dc.identifier.urihttp://dx.doi.org/10.1007/s11135-009-9243-xen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/32352
dc.identifier.wosnumberWOS:000280479500012
dc.language.isoen_USen_US
dc.subjectAsymmetric tolerancesen_US
dc.subjectCritical valueen_US
dc.subjectProcess accuracyen_US
dc.subjectProcess centeringen_US
dc.titleEstimating and testing process accuracy with extension to asymmetric tolerancesen_US
dc.typeArticleen_US

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