Browsing by Author "HO, JH"
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Item type:Item, A REAL-TIME C-V MEASUREMENT CIRCUIT FOR MOS CAPACITORS UNDER CURRENT STRESSING(1991-08-01)Item type:Item, ELLIPSOMETRY MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX AND THICKNESS OF POLYSILICON THIN-FILMS(1990-02-01)Item type:Item, ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS(1990-08-01)Item type:Item, ELLIPSOMETRY MEASUREMENTS ON SIO2-FILMS FOR THICKNESSES UNDER 200-A(1987-09-01)Item type:Item, ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMS(1988-08-01)Item type:Item, REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY(1989-08-03)