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學術出版;;Publications
期刊論文;;Articles
ELLIPSOMETRY MEASUREMENTS ON SIO2-FILMS FOR THICKNESSES UNDER 200-A
ELLIPSOMETRY MEASUREMENTS ON SIO2-FILMS FOR THICKNESSES UNDER 200-A
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Date
1987-09-01
Authors
HO, JH
LEE, CL
JEN, CW
LEI, TF
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https://ir.lib.nycu.edu.tw/handle/11536/4621
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