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學術出版;;Publications
期刊論文;;Articles
ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS
ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS
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A1990DP83600016.pdf
(655.64 KB)
Date
1990-08-01
Authors
HO, JH
LEE, CL
LEI, TF
Journal Title
Journal ISSN
Volume Title
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DOI
10.1109/19.57248
Abstract
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URI
http://dx.doi.org/10.1109/19.57248
https://ir.lib.nycu.edu.tw/handle/11536/4056
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