ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS
| dc.citation.epage | 648 | en_US |
| dc.citation.issue | 4 | en_US |
| dc.citation.spage | 642 | en_US |
| dc.citation.volume | 39 | en_US |
| dc.citation.woscount | 1 | |
| dc.contributor.author | HO, JH | en_US |
| dc.contributor.author | LEE, CL | en_US |
| dc.contributor.author | LEI, TF | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:05:32Z | |
| dc.date.available | 2014-12-08T15:05:32Z | |
| dc.date.issued | 1990-08-01 | en_US |
| dc.identifier.doi | 10.1109/19.57248 | en_US |
| dc.identifier.issn | 0018-9456 | en_US |
| dc.identifier.journal | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/19.57248 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4056 | |
| dc.identifier.wosnumber | WOS:A1990DP83600016 | |
| dc.language.iso | en_US | en_US |
| dc.title | ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS | en_US |
| dc.type | Article | en_US |