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Showing results 3 to 7 of 7 < previous 
Issue DateTitleAuthor(s)
1-Mar-2011Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei; Hung, Cheng-Chou; Huang, Sheng-Yi; Fan, Cheng-Wen; Tzeng, Chih-Yuh; Chou, Sam; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Power Improvement for 65nm nMOSFET with High-Tensile CESL and Fast Nonlinear Behavior ModelingChiu, Chia-Sung; Chen, Kun-Ming; Huang, Guo-Wei; Lin, Shu-Yu; Chen, Bo-Yuan; Hung, Cheng-Chou; Huang, Sheng-Yi; Fan, Cheng-Wen; Tzeng, Chih-Yuh; Chou, Sam; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2009Radio-Frequency Small-Signal and Noise Modeling for Silicon-on-Insulator Dynamic Threshold Voltage Metal-Oxide-Semiconductor Field-Effect TransistorsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009Temperature Dependences of RF Small-Signal Characteristics for the SOI Dynamic Threshold Voltage MOSFETWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2010Temperature-Dependent RF Small-Signal and Noise Characteristics of SOI Dynamic Threshold Voltage MOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Liao, Kuo-Hsiang; Chen, Bo-Yuan; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 3 to 7 of 7 < previous