National Chiao Tung University Institutional Repository：Browsing IR@NCTU

Browsing by Author Chao, Pei-Jung

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Issue Date	Title	Author(s)
2015	Process Variation Effect, Metal-Gate Work-Function Fluctuation and Random Dopant Fluctuation of 10-nm Gate-All-Around Silicon Nanowire MOSFET Devices	Li, Yiming; Chang, Han-Tung; Lai, Chun-Ning; Chao, Pei-Jung; Chen, Chieh-Yang; 交大名義發表; 傳播研究所; 分子醫學與生物工程研究所; 電機學院; National Chiao Tung University; Institute of Communication Studies; Institute of Molecular Medicine and Bioengineering; College of Electrical and Computer Engineering
2016	Statistical Device Simulation of Characteristic Fluctuation of 10-nm Gate-All-Around Silicon Nanowire MOSFETs Induced by Various Discrete Random Dopants	Sung, Wen-Li; Chang, Han-Tung; Chen, Chieh-Yang; Chao, Pei-Jung; Li, Yiming; 分子醫學與生物工程研究所; 電機工程學系; 電信工程研究所; Institute of Molecular Medicine and Bioengineering; Department of Electrical and Computer Engineering; Institute of Communications Engineering
1-Jan-2017	Timing and Power Fluctuations on Gate-All-Around Nanowire CMOS Circuit Induced by Various Sources of Random Discrete Dopants	Sung, Wen-Li; Chao, Pei-Jung; Li, Yiming; 分子醫學與生物工程研究所; 電信工程研究所; Institute of Molecular Medicine and Bioengineering; Institute of Communications Engineering
2017	奈米氮化鈦晶粒對全閘極奈米線互補式金氧半場效應電晶體電路功率與延遲特性擾動之研究	趙培蓉; 李義明; Chao, Pei-Jung; Li, Yiming; 生醫工程研究所

Showing results 3 to 6 of 6 < previous