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Showing results 1 to 10 of 10
Issue DateTitleAuthor(s)
19-Nov-2001Ab initio study of the structural and optical properties of orthorhombic ternary nitride crystalsHuang, JY; Tang, LC; Lee, MH; 光電工程學系; Department of Photonics
10-Sep-2003Cation substitution effects on structural, electronic and optical properties of nonlinear optical AgGa(SxSe1-x)(2) crystalsTang, LC; Lee, MH; Yang, CH; Huang, JY; Chang, CS; 光電工程學系; Department of Photonics
2003Characteristics of Schottky barrier poly-Si thin film transistors with excimer laser annealing treatmentYeh, KL; Lin, HC; Tsai, RW; Lee, MH; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Determination of effective density-of-states using a novel Schottky barrier poly-Si thin-film transistorLin, HC; Lee, MH; Yeh, KL; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-2005Exploring high school students' and teachers' preferences toward the constructivist Internet-based learning environments in TaiwanLee, MH; Tsai, CC; 教育研究所; Institute of Education
1-Apr-2003Fabrication and characterization of Schottky barrier polysilicon thin-film transistors with excimer-laser crystallized channelYeh, KL; Lin, HC; Tsai, RW; Lee, MH; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
23-Nov-2005New infrared nonlinear optical crystal CsGeBr3: synthesis, structure and powder second-harmonic generation propertiesTang, LC; Huang, JY; Chang, CS; Lee, MH; Liu, LQ; 光電工程學系; Department of Photonics
2004A novel methodology for extracting effective density-of-states in poly-Si thin-film transistorsLin, HC; Yeh, KL; Lee, MH; Su, YC; Huang, TY; Shen, SW; Lin, HY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2005A simple and low-cost method to fabricate TFTs with poly-Si nanowire channelLin, HC; Lee, MH; Su, CJ; Huang, TY; Lee, CC; Yang, YS; 生物科技學系; 電子工程學系及電子研究所; Department of Biological Science and Technology; Department of Electronics Engineering and Institute of Electronics
1-Jul-2006Spatially resolving the hot carrier degradations of poly-Si thin-film transistors using a novel test structureLin, HC; Lee, MH; Chang, KH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 10 of 10