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Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
2005Channel backscattering characteristics of strained PMOSFETs with embedded SiGe source/drainLin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2005Channel backscattering characteristics of uniaxially strained nanoscale CMOSFETsLin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2003High-performance P-channel Schottky-barrier SOI FinFET featuring self-aligned PtSi source/drain and electrical junctionsLin, HC; Wang, MF; Hou, FJ; Lin, HN; Lu, CY; Liu, JT; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005The impact of uniaxial strain engineering on channel backscattering in nanoscale MOSFETsLin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; Tang, DD; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2000Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt filmLin, HN; Chang, CR; Chiou, YH; 電子物理學系; Department of Electrophysics
1-May-1998Magnetic force microscopy study of domain walls on a thin cobalt filmLin, HN; Chiou, YH; Chen, BM; Shieh, HPD; Chang, CR; 電子物理學系; 光電工程學系; Department of Electrophysics; Department of Photonics
7-Apr-2001Nanoscale surface electrical properties of indium-tin-oxide films for organic light emitting diodes investigated by conducting atomic force microscopyLin, HN; Chen, SH; Perng, GY; Chen, SA; 電子物理學系; Department of Electrophysics
1-Oct-2000Surface roughness measurement on microchannels by atomic force microscopy using a bent tapered fiber probeChen, SH; Lin, HN; Yang, CR; 電子物理學系; Department of Electrophysics
Showing results 1 to 8 of 8