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Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
1-May-2014Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process CharacterizationLuo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-May-2014Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process CharacterizationLuo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Mar-2012Minimizing variation in the electrical characteristics of gate-all-around thin film transistors through the use of multiple-channel nanowire and NH3 plasma treatmentHuang, Po-Chun; Chen, Lu-An; Chen, Chen-Chia; Sheu, Jeng-Tzong; 材料科學與工程學系; Department of Materials Science and Engineering
2013The Process and Stress-Induced Variability Issues of Trigate CMOS DevicesChung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013The Variability Issues in Small Scale Trigate CMOS Devices: Random Dopant and Trap Induced FluctuationsChung, Steve S.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1997應用於量子系統中的微正則系綜數值方法與廣義邊界微擾變分方法王仲仁; Wang, Jone-Zen; 楊宗哲; Yang Tzong-Jer; 電子物理系所
2011應用模式預測控制以穩定具變動特性的半導體供應鏈之投料與存貨李昶律; Lee, ChangLu; 陳穆臻; Chen, Mu-Chen; 運輸與物流管理學系
2008異變吳柏璋; Wu, Po-Chang; 張基義; Chang, Chi-Yi; 建築研究所
Showing results 1 to 8 of 8