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Browsing by Subject p-channel metal-oxide-semiconductor field-effect transistors (p-MOSFETs)

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Issue DateTitleAuthor(s)
1-Jan-2001New degradation mechanisms of width-dependent hot carrier effect in quarter-micron shallow-trench-isolated p-channel metal-oxide-semiconductor field-effect-transistorsChung, SS; Chen, SJ; Yang, WJ; Yih, CM; Yang, JJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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