Browsing by Subject robust delay testing
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| 1-Sep-1997 | Identification of robust untestable path delay faults | Wu, WC; Lee, CL; Chen, JE; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |