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顯示 1 到 8 筆資料，總共 8 筆
公開日期標題作者
21-八月-1995ABRUPTNESS OF GE COMPOSITION AT THE SI/SIGE INTERFACE GROWN BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITIONTSAI, WC; CHANG, CY; JUNG, TG; LIOU, TS; HUANG, GW; CHANG, TC; CHEN, LP; LIN, HC; 電控工程研究所; Institute of Electrical and Control Engineering
13-十一月-1995BORON INCORPORATION IN SI1-XGEX FILMS GROWN BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION USING SI2H6 AND GEH4CHEN, LP; CHOU, CT; HUANG, GW; TSAI, WC; CHANG, CY; 電控工程研究所; Institute of Electrical and Control Engineering
15-十月-1994CHARACTERIZATION OF THE SI/SIGE HETEROJUNCTION DIODE GROWN BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITIONJUNG, TG; CHANG, CY; LIU, CS; CHANG, TC; LIN, HC; TSAI, WC; HUANG, GW; CHEN, LP; 電控工程研究所; Institute of Electrical and Control Engineering
1-十月-1995EFFECTS OF DRY-ETCHING DAMAGE REMOVAL ON LOW-TEMPERATURE SILICON SELECTIVE EPITAXIAL-GROWTHTSENG, HC; CHANG, CY; PAN, FM; CHEN, LP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-1995EFFECTS OF DRY-ETCHING DAMAGE REMOVAL ON LOW-TEMPERATURE SILICON SELECTIVE EPITAXIAL-GROWTHTSENG, HC; CHANG, CY; PAN, FM; CHEN, LP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-1995EFFECTS OF POLYSILICON ELECTRON-CYCLOTRON-RESONANCE ETCHING ON ELECTRICAL CHARACTERISTICS OF GATE OXIDESKANG, TK; UENG, SY; DAI, BT; CHEN, LP; CHENG, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-七月-1995EPITAXY OF SI1-XGEX BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION USING SI2H6 AND GEH4CHEN, LP; CHOU, TC; TSAI, WC; HUANG, GW; TSENG, HC; LIN, HC; CHANG, CY; 電控工程研究所; Institute of Electrical and Control Engineering
26-九月-1994FABRICATION OF P-CHANNEL POLYCRYSTALLINE SI1-XGEX THIN-FILM TRANSISTORS BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITIONLIN, HC; JUNG, TG; LIN, HY; CHANG, CY; CHEN, LP; 電控工程研究所; Institute of Electrical and Control Engineering
顯示 1 到 8 筆資料，總共 8 筆