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公開日期標題作者
1-十一月-2009Characterization of AC Hot-Carrier Effects in Poly-Si Thin-Film TransistorsLin, Horng-Chih; Chang, Kai-Hsiang; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2007Effective density-of-states distribution of polycrystalline silicon thin-film transistors under hot-carrier degradationLee, Ming-Hsien; Chang, Kai-Hsiang; Lin, Horng-Chih; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2007Spatially and temporally resolving the degradation of n-channel poly-Si thin-film transistors under hot-carrier stressingLee, Ming-Hsien; Chang, Kai-Hsiang; Lin, Horng-Chih; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Spatially resolving the degradation of SPC thin-film transistors under AC stressChang, Kai-Hsiang; Lee, Ming-Hsien; Lin, Horng-Chih; Huang, Tiao-Yuan; Lee, Yao-Jen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2019Suppression of "volcano" morphology and parasitic defect luminescence in AlGaN-based deep-UV light-emitting diode epitaxyHuang, Chia-Yen; Liu, Tsung-Yen; Huang, Shih-Ming; Chang, Kai-Hsiang; Tai, Tsu-Ying; Kuan, Chieh-Hsiung; Chang, Joseph Tung-Chieh; Lin, Ray-Ming; Kuo, Hao-Chung; 光電工程學系; 光電工程研究所; Department of Photonics; Institute of EO Enginerring
2009使用基底擴展模型實現OFDM通道估測之研究張凱翔; Chang, Kai-Hsiang; 謝世福; Hsieh, Shih-Fu; 電信工程研究所