Spatially resolving the degradation of SPC thin-film transistors under AC stress

標題:	Spatially resolving the degradation of SPC thin-film transistors under AC stress
作者:	Chang, Kai-Hsiang Lee, Ming-Hsien Lin, Horng-Chih Huang, Tiao-Yuan Lee, Yao-Jen 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	2007
URI:	http://hdl.handle.net/11536/12056
ISBN:	978-1-4244-1891-6
期刊:	2007 INTERNATIONAL SEMICONDUCTOR DEVICE RESEARCH SYMPOSIUM, VOLS 1 AND 2
起始頁:	246
結束頁:	247
顯示於類別：	會議論文