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公開日期標題作者
31-十月-2007Advance in next Century nanoCMOSFET researchHwang, Huey-Liang; Chiou, Yan-Kai; Chang, Che-Hao; Wang, Chen-Chan; Lee, Kun-Yu; Wu, Tai-Bor; Kwo, Raynien; Hong, Minghwei; Chang-Liao, Kuei-Shu; Lu, Chun-Yuan; Lu, Chun-Chang; Chiu, Fu-Chien; Chen, Chun-Heng; Lee, Joseph Ya-Min; Chin, Albert; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
22-十二月-2008Crucial integration of high work-function metal gate and high-k blocking oxide on charge-trapping type flash memory deviceTsai, Ping-Hung; Chang-Liao, Kuei-Shu; Yang, Dong-Wei; Chung, Yuan-Bin; Wang, Tien-Ko; Tzeng, P. J.; Lin, C. H.; Lee, L. S.; Tsai, M. J.; Chin, Albert; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008National Project on 45 to 32 nm Metal Oxide Semiconductor Field Effect Transistors for Next Century IC FabricationsHwang, Huey-liang; Wang, C. W.; Chang, K. H.; Tsai, C. H.; Leou, K. C.; Chang-Liao, Kuei-Shu; Lu, Chun-Chang; Chang, S. C.; Chiu, F. C.; Liu, C. H.; Chin, Albert; Chang, Kow-Ming; Chen, Bwo-Ning; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013Record-high 121/62 mu A/mu m on-currents 3D stacked epi-like Si FETs with and without metal back gateYang, Chih-Chao; Chen, Szu-Hung; Shieh, Jia-Min; Huang, Wen-Hsien; Hsieh, Tung-Ying; Shen, Chang-Hong; Wu, Tsung-Ta; Wang, Hsing-Hsiang; Lee, Yao-Jen; Hou, Fu-Ju; Pan, Ci-Ling; Chang-Liao, Kuei-Shu; Hu, Chenming; Yang, Fu-Liang; 光電工程學系; Department of Photonics
1-四月-2008Using spike-anneal to reduce interfacial layer thickness and leakage current in metal-oxide-semiconductor devices with TaN/Atomic layer deposition-grown HfAlO/chemical oxide/Si structureTsai, Bo-An; Lee, Yao-Jen; Peng, Hsin-Yi; Tzeng, Pei-Jer; Luo, Chih-wei; Chang-Liao, Kuei-Shu; 電子物理學系; Department of Electrophysics
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