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公開日期標題作者
2011Detecting Stability Faults in Sub-threshold SRAMsLin, Chen-Wei; Yang, Hao-Yu; Huang, Chin-Yuan; Chen, Hung-Hsin; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Fault Models and Test Methods for Subthreshold SRAMsLin, Chen-Wei; Chen, Hung-Hsin; Yang, Hao-Yu; Chao, Mango C-T; Huang, Rei-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2013Fault Models and Test Methods for Subthreshold SRAMsLin, Chen-Wei; Chen, Hung-Hsin; Yang, Hao-Yu; Huang, Chin-Yuan; Chao, Mango C. -T.; Huang, Rei-Fu; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
2012Plasmonic thermal emitter using perfect absorber made of metallic disk on SiO2Abbas, Mohammed Nadhim; Cheng, Cheng-Wen; Chang, Yia-Chung; Shih, Min-Hsiung; Chen, Hung-Hsin; Lee, Si-Chen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012Testing Strategies for a 9T Sub-threshold SRAMYang, Hao-Yu; Lin, Chen-Wei; Chen, Hung-Hsin; Chao, Mango C. -T.; Tu, Ming-Hsien; Jou, Shyh-Jye; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010測試次臨界電壓的靜態隨機存取記憶體的開路陳弘昕; Chen, Hung-Hsin; 趙家佐; Chao, Chia-Tso; 電子研究所
2010薄件射出成型於充填時之二維流動模擬陳宏信; Chen, Hung-Hsin; 周長彬; Chou, Chang-Ping; 機械工程學系
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