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顯示 1 到 12 筆資料，總共 12 筆
公開日期標題作者
3-七月-2013Device Simulation-Based Multiobjective Evolutionary Algorithm for Process Optimization of Semiconductor Solar CellsLi, Yiming; Chen, Yu-Yu; Chen, Chieh-Yang; Shen, Cheng-Han; Cheng, Hui-Wen; Lo, I-Hsiu; Chen, Chun-Nan; 資訊工程學系; Department of Computer Science
2013Experimentally Effective Clean Process to C-V Characteristic Variation Reduction of HKMG MOS DevicesChen, Chien-Hung; Li, Yiming; Chen, Chieh-Yang; Chen, Yu-Yu; Hsu, Sheng-Chia; Huang, Wen-Tsung; Chu, Sheng-Yuan; 電機工程學系; Department of Electrical and Computer Engineering
1-九月-2013The intrinsic parameter fluctuation on high-kappa/metal gate bulk FinFET devicesLi, Yiming; Su, Hsin-Wen; Chen, Yu-Yu; Hsu, Sheng-Chia; Huang, Wen-Tsung; 資訊工程學系; Department of Computer Science
1-九月-2013Mobility model extraction for surface roughness of SiGe along (110) and (100) Orientations in HKMG bulk FinFET devicesChen, Chien-Hung; Li, Yiming; Chen, Chieh-Yang; Chen, Yu-Yu; Hsu, Sheng-Chia; Huang, Wen-Tsung; Chu, Sheng-Yuan; 資訊工程學系; Department of Computer Science
2012Multi-Objective Display Panel Design Optimization using Circuit Simulation-Based Evolutionary AlgorithmChen, Yu-Yu; Li, Yiming; Chen, Chieh-Yang; Chiang, Chien-Hshueh; 傳播研究所; Institute of Communication Studies
1-一月-2013On Characteristic Variability of 16-nm-Gate Bulk FinFET Devices Induced by Intrinsic Parameter Fluctuation and Process Variation EffectChen, Chieh-Yang; Li, Yiming; Chen, Yu-Yu; Chang, Han-Tung; Hsu, Sheng-Chia; Huang, Wen-Tsung; Yang, Chin-Min; Chen, Li-Wen; 資訊工程學系; Department of Computer Science
2012On Statistical Variation of MOSFETs Induced by Random-Discrete-Dopants and Random-Interface-TrapsLi, Yiming; Su, Hsin-Wen; Chen, Chieh-Yang; Cheng, Hui-Wen; Chen, Yu-Yu; Chang, Han-Tung; 資訊工程學系; Department of Computer Science
2012Random Work Function Induced DC Characteristic Fluctuation in 16-nm High-kappa/Metal Gate Bulk and SOI FinFETsSu, Hsin-Wen; Chen, Yu-Yu; Chen, Chieh-Yang; Cheng, Hui-Wen; Chang, Han-Tung; Li, Yiming; 電機工程學系; Department of Electrical and Computer Engineering
1-一月-2014Random-work-function-induced characteristic fluctuation in 16-nm-gate bulk and SOI FinFETsLi, Yiming; Chen, Chieh-Yang; Chen, Yu-Yu; 資訊工程學系; Department of Computer Science
1-一月-2013Statistical Device Simulation of Intrinsic Parameter Fluctuation in 16-nm-Gate N- and P-type Bulk FinFETsChen, Yu-Yu; Huang, Wen-Tsung; Hsu, Sheng-Chia; Chang, Han-Tung; Chen, Chieh-Yang; Yang, Chin-Min; Chen, Li-Wen; Li, Yiming; 資訊工程學系; Department of Computer Science
1-一月-2015Upper/lower-side random dopant fluctuation on 16-nm-gate HKMG bulk FinFETLi, Yiming; Huang, Wen-Tsung; Chen, Chieh-Yang; Chen, Yu-Yu; 資訊工程學系; Department of Computer Science
2013離散摻雜位置效應以及隨機金屬晶粒在塊材鰭式場效應電晶體特性影響之研究陳昱宇; Chen, Yu-Yu; 李義明; Li, Yiming; 電信工程研究所
顯示 1 到 12 筆資料，總共 12 筆