| 標題: | On Characteristic Variability of 16-nm-Gate Bulk FinFET Devices Induced by Intrinsic Parameter Fluctuation and Process Variation Effect |
| 作者: | Chen, Chieh-Yang Li, Yiming Chen, Yu-Yu Chang, Han-Tung Hsu, Sheng-Chia Huang, Wen-Tsung Yang, Chin-Min Chen, Li-Wen 資訊工程學系 Department of Computer Science |
| 公開日期: | 1-一月-2013 |
| 摘要: | |
| URI: | http://hdl.handle.net/11536/124975 |
| ISBN: | 978-1-4799-0811-0; 978-1-4799-0812-7 |
| ISSN: | 1548-3770 |
| 期刊: | 2013 71ST ANNUAL DEVICE RESEARCH CONFERENCE (DRC) |
| 起始頁: | 137 |
| 結束頁: | 138 |
| 顯示於類別： | 會議論文 |
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