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2012Characteristics of the SiN Uniaxial Strained NMOSFET with Channel Fluorine ImplantationChen, Yung-Yu; Hsieh, Chih-Ren; Chiu, Fang-Yu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
17-一月-2011Constant voltage stress induced charge trapping and detrapping characteristics of the Si(3)N(4) uniaxial strained n-channel metal-oxide-semiconductor field-effect-transistor with fluorinated HfO(2)/SiON gate stackChen, Yung-Yu; Hsieh, Chih-Ren; Chiu, Fang-Yu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
17-一月-2011Constant voltage stress induced charge trapping and detrapping characteristics of the Si3N4 uniaxial strained n-channel metal-oxide-semiconductor field-effect-transistor with fluorinated HfO2/SiON gate stackChen, Yung-Yu; Hsieh, Chih-Ren; Chiu, Fang-Yu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2012Stress immunity enhancement of the SiN uniaxial strained n-channel metal-oxide-semiconductor field-effect-transistor by channel fluorine implantationChen, Yung-Yu; Hsieh, Chih-Ren; Chiu, Fang-Yu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010氟摻雜對應變矽於二氧化鉿堆疊式金氧半場效電晶體其特性和可靠度的影響邱芳毓; Chiu, Fang-Yu; 羅正忠; Lou, Jen-Chung; 電子研究所
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