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公開日期標題作者
1-五月-2014Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process CharacterizationLuo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2014Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process CharacterizationLuo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Mask versus Schematic - An Enhanced Design-Verification Flow for First Silicon SuccessLuo, Tseng-Chin; Leong, Eric; Chao, Mango C-T; Fisher, Philip A.; Chang, Wen-Hsiang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2011A Novel Array-Based Test Methodology for Local Process Variation MonitoringLuo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael Shien-Yang; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Fisher, Philip A.; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2012A Novel Design Flow for Dummy Fill Using Boolean Mask OperationsLuo, Tseng-Chin; Chao, Mango C. -T.; Fisher, Philip A.; Kuo, Chun-Ren; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 1 到 5 筆資料，總共 5 筆