瀏覽 的方式: 作者 Han, Chien-Yuan

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公開日期標題作者
15-一月-2011Assessment of interface roughness during plasma etching through the use of real-time ellipsometryHan, Chien-Yuan; Lai, Chien-Wen; Chao, Yu-Faye; Leou, Ke-Ciang; Lin, Tsang-Lang; 光電工程學系; Department of Photonics
1-一月-2008Determining thickness of films on a curved substrate by use of ellipsometric measurementHan, Chien-Yuan; Lee, Zhen-You; Chao, Yu-Faye; 光電工程學系; Department of Photonics
10-六月-2009Determining thickness of films on a curved substrate by use of ellipsometric measurementsHan, Chien-Yuan; Lee, Zhen-You; Chao, Yu-Faye; 光電工程學系; Department of Photonics
1-一月-2013Developing a Phase and Intensity Measurement Technique with Multiple Incident Angles under Surface Plasmon Resonance ConditionHan, Chien-Yuan; You, Du Cheng; Chen, Yi-Ren; Chao, Yu-Faye; 光電工程學系; Department of Photonics
1-九月-2016Generating Radially and Azimuthally Polarized Beams by Using a Pair of Lateral Displacement BeamsplittersHan, Chien-Yuan; Wei, Zhi-Hao; Hsu, Yung; Chen, Kun-Huang; Yeh, Chien-Hung; Wu, Wei-Xuan; Chen, Jing-Heng; 光電工程研究所; Institute of EO Enginerring
20-二月-2007Post flight analysis of the surface plasmon resonance enhanced photoelastic modulated ellipsometryChao, Yu-Faye; Han, Chien-Yuan; 光電工程學系; Department of Photonics
6-八月-2018Prism-hologram-prism sandwiched recording method for polarization-selective substrate-mode volume holograms with a large diffraction angleHsu, Fan-Hsi; Han, Chien-Yuan; Chen, Kun-Huang; Hsu, Ken-Yuh; Chen, Jing-Heng; 光電工程學系; Department of Photonics