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公開日期標題作者
26-十二月-2011Distribution of electronic reconstruction at the n-type LaAlO(3)/SrTiO(3) interface revealed by hard x-ray photoemission spectroscopyChu, Y. Y.; Liao, Y. F.; Tra, V. T.; Yang, J. C.; Liu, W. Z.; Chu, Y. H.; Lin, J. Y.; Huang, J. H.; Weinen, J.; Agrestini, S.; Tsuei, K. -D.; Huang, D. J.; 材料科學與工程學系; 物理研究所; Department of Materials Science and Engineering; Institute of Physics
26-十二月-2011Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface revealed by hard x-ray photoemission spectroscopyChu, Y. Y.; Liao, Y. F.; Tra, V. T.; Yang, J. C.; Liu, W. Z.; Chu, Y. H.; Lin, J. Y.; Huang, J. H.; Weinen, J.; Agrestini, S.; Tsuei, K. -D.; Huang, D. J.; 材料科學與工程學系; 物理研究所; Department of Materials Science and Engineering; Institute of Physics
15-二月-2008Investigations of organic light emitting diodes with CdSe(ZnS) quantum dotsLee, C. W.; Chou, C. H.; Huang, J. H.; Hsu, C. S.; Nguyen, T. P.; 應用化學系; Department of Applied Chemistry
2012Structural Design, Process, and Reliability of a Wafer-Level 3D Integration Scheme with Cu TSVs Based on Micro-bump/Adhesive Hybrid Wafer BondingKo, C. T.; Hsiao, Z. C.; Chang, Y. J.; Chen, P. S.; Huang, J. H.; Fu, H. C.; Huang, Y. J.; Chiang, C. W.; Lee, C. K.; Chang, H. H.; Tsai, W. L.; Chen, Y. H.; Lo, W. C.; Chen, K. N.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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