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1-六月-1996CCDES - A collaborative compound document editing systemLin, CH; Huang, SC; Yuan, SM; 資訊工程學系; Department of Computer Science
2006Degradation of capacitance-voltage characteristics induced by self-heating effect in poly-si TFTsTai, YH; Huang, SC; Chiu, HL; 光電工程學系; Department of Photonics
2000Effect of TiN treated by rapid thermal annealing on properties of BST capacitors prepared by RF magnetron co-sputter system at low substrate temperatureTeng, TH; Hwang, CC; Lai, MJ; Huang, SC; Chen, JS; Jaing, CC; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-1997Effects of RCA clean-up procedures on the formation of roughened poly-Si electrodes for high-density DRAMs' capacitorsLiu, HW; Lai, WK; Yu, SY; Huang, SC; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-1997Effects of RCA clean-up procedures on the formation of roughened poly-Si electrodes for high-density DRAMs' capacitorsLiu, HW; Lai, WK; Yu, SY; Huang, SC; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004Energy-aware, load balanced routing schemes for sensor networksHuang, SC; Jan, RH; 資訊工程學系; Department of Computer Science
1997Formation and properties of roughened poly-Si electrodes for high-density DRAMsLiu, HW; Lin, ZJ; Yu, SY; Huang, SC; Cheng, SC; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
1-七月-2006High-peak-power AlGaInAs quantum-well 1.3-mu m laser pumped by a diode-pumped actively Q-switched solid-state laserSu, KW; Huang, SC; Li, A; Liu, SC; Chen, YF; Huang, KF; 電子物理學系; Department of Electrophysics
2001Investigation on ESD robustness of CMOS devices in a 1.8-v 0.15-mu m partially-depleted SOI salicide CMOS technologyKer, MD; Hong, KK; Chen, TY; Tang, H; Huang, SC; Chen, SS; Huang, CT; Wang, MC; Loh, YT; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2001Novel diode structures and ESD protection circuits in a 1.8-V 0.15-mu m partially-depleted SOI salicided CMOS processKer, MD; Hung, KK; Tang, HTH; Huang, SC; Chen, SS; Wang, MC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-1998Optimal MISO repetitive control system design using mixed time and frequency domain criteriaHu, JS; Yu, SH; Huang, SC; 電控工程研究所; Institute of Electrical and Control Engineering
2000Plasma process induced damage in sputtered TiN metal gate capacitors with ultra-thin nitrided oxideChen, CC; Lin, HC; Chang, CY; Chao, TS; Huang, SC; Wu, WF; Huang, TY; Liang, MS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2005Subwavelength gratings fabricated on semiconductor substrates via E-beam lithography and lift-off methodSun, KW; Huang, SC; Kechiantz, A; Lee, CP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1995The Trefftz method as an integral equationHuang, SC; Shaw, RP; 交大名義發表; National Chiao Tung University
1-六月-1996Zeeman studies of the first excited states of palladium and metal free phthalocyanines in Shpol'skii matrixHuang, SC; Chen, WH; 交大名義發表; 電子物理學系; National Chiao Tung University; Department of Electrophysics
顯示 1 到 15 筆資料，總共 15 筆