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Browsing by Author Jiunn-Pey Wu

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Issue DateTitleAuthor(s)
1994不同氧化層厚度次微米 LDD MOS 元件中熱載子導致元件的退化分析吳俊沛; Jiunn-Pey Wu; 莊紹勳; Steve Shao-Shiun Chung; 電子研究所
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