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公開日期標題作者
2009Flicker Noise in Nanoscale pMOSFETs with Mobility Enhancement Engineering and Dynamic Body BiasesYeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013The Impact of Layout Dependent Stress and Gate Resistance on High Frequency Performance and Noise in Multifinger and Donut MOSFETsKu, Chih-You; Yeh, Kuo-Ling; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010The Impact of MOSFET Layout Dependent Stress on High Frequency Characteristics and Flicker NoiseYeh, Kuo-Liang; Ku, Chih-You; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2010The Impact of Uni-axial Strain on Low Frequency Noise in Nanoscale p-Channel Metal-Oxide-Semiconductor Field Effect Transistors under Dynamic Body BiasesYeh, Kuo-Liang; Ku, Chih-You; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009Low Frequency Noise in Nanoscale pMOSFETs with Strain Induced Mobility Enhancement and Dynamic Body BiasesYeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010射頻金氧半場效電晶體元件佈局對高頻特性與低頻雜訊之影響以應用於射頻與類比電路古智友; Ku, Chih-You; 郭治群; Guo, Jyh-Chyurn; 電子研究所