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1-五月-2010Enhanced Carrier-Mobility-Fluctuation Origin Low-Frequency Noise in Uniaxial Strained PMOSFETsKuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009Impact of Uniaxial Strain on Channel Backscattering Characteristics and Drain Current Variation for Nanoscale PMOSFETsLee, Wei; Kuo, Jack J. -Y.; Chen, Willian P. -N.; Su, Pin; Jeng, Min-Chie; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2009Impact of Uniaxial Strain on Low-Frequency Noise in Nanoscale PMOSFETsKuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009Investigation of Low Frequency Noise in Uniaxial Strained PMOSFETsKuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2007On the enhanced impact ionization in uniaxial strained p-MOSFETsSu, Pin; Kuo, Jack J. -Y.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013Source/Drain Series Resistance Induced Feedback Effect on Drain Current Mismatch and Its ImplicationKuo, Jack J. -Y.; Fan, Ming-Long; Lee, Wei; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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