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公開日期標題作者
2007Bias temperature instabilities for low-temperature polycrystalline silicon complementary thin-film transistorsChen, Chih-Yang; Lee, Jam-Wem; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005A compact model for electrostatic discharge protection nanoelectronics simulationChou, Hung-Mu; Yu, Shao-Ming; Lee, Jam-Wem; Li, Yiming; 電信工程研究所; 友訊交大聯合研發中心; Institute of Communications Engineering; D Link NCTU Joint Res Ctr
2007Enhanced performance and reliability for solid phase crystallized poly-Si TFTs with argon ion implantationChang, Chia-Wen; Chang, Che-Lun; Luo, Wun-Chen; Lee, Jam-Wem; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Improvement of electrical characteristics for novel process-compatible floating channel solid-phase crystallized poly-Si TFTsChang, Chia-Wen; Chang, Che-Lun; Lee, Jam-Wem; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Performance and reliability improvement for poly-Si TFTs using fluorinated silicate glass inter-layer-dielectric passivationChang, Chia-Wen; Wu, Tin-Wei; Wang, Tong-Yi; Chang, Che-Lun; Lee, Jam-Wem; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2006Plasma damage-enhanced negative bias temperature instability in low-temperature polycrystalline silicon thin-film transistorsChen, Chih-Yang; Lee, Jam-Wem; Chen, Wei-g Chen; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Po-Hao; Wang, Shen-De; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Plasma-induced damage on the performance and reliability of low-temperature polycrystalline silicon thin-film transistorsChen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wem; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2007A reliability model for low-temperature polycrystalline silicon thin-film transistorsChen, Chih-Yang; Lee, Jam-Wem; Lee, Po-Hao; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Ma, Ming-Wen; Wang, Shen-De; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2004Silicon-Germanium Structure in Surrounding-Gate Strained Silicon Nanowire Field Effect TransistorsLi, Yiming; Lee, Jam-Wem; Chou, Hung-Mu; 電子物理學系; 友訊交大聯合研發中心; Department of Electrophysics; D Link NCTU Joint Res Ctr
顯示 1 到 9 筆資料，總共 9 筆