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公開日期標題作者
21-九月-2009Application of secondary electron potential contrast on junction leakage isolationLiu, Po-Tsun; Lee, Jeng-Han; Huan, Y. S.; Su, David; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-一月-2007Dynamic ink-jet printing analysis system with addressable waveform trimmingHuang, Chieh-Yi; Shang, Kuo-Chiang; Wu, Kuo-Hua; Lee, Jeng-Han; Liu, Tsu-Min; Cheng, Kevin; Wu, Bing-Fei; 電控工程研究所; Institute of Electrical and Control Engineering
1-十月-2011Inspection of the Current-Mirror Mismatch by Secondary Electron Potential Contrast With In Situ Nanoprobe BiasingLiu, Po-Tsun; Lee, Jeng-Han; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-七月-2011Profiling p(+)/n-Well Junction by Nanoprobing and Secondary Electron Potential ContrastLiu, Po-Tsun; Lee, Jeng-Han; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-一月-2012Surface Potential and Electric Field Mapping of p-well/n-well Junction by Secondary Electron Potential Contrast and in-situ Nanoprobe biasingLee, Jeng-Han; Liu, Po-Tsun; Wang, M. H.; Lin, Y. T.; Huan, Y. S.; Su, David; 顯示科技研究所; Institute of Display
1-七月-2012Surface potential mapping of p(+)/n-well junction by secondary electron potential contrast with in situ nano-probe biasingLee, Jeng-Han; Liu, Po-Tsun; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2011二次電子電壓對比應用於摻雜分佈與缺陷定位之研究李正漢; Lee, Jeng-Han; 劉柏村; Liu, Po-Tsun; 光電工程學系
顯示 1 到 7 筆資料，總共 7 筆