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20103D Device Simulation of Work Function and Interface Trap Fluctuations on High-kappa/Metal Gate DevicesCheng, Hui-Wen; Li, Fu-Hai; Han, Ming-Hung; Yiu, Chun-Yen; Yu, Chia-Hui; Lee, Kuo-Fu; Li, Yiming; 傳播研究所; Institute of Communication Studies
1-十月-2011Ambient Stability Enhancement of Thin-Film Transistor With InGaZnO Capped With InGaZnO:N Bilayer Stack Channel LayersLiu, Po-Tsun; Chou, Yi-Teh; Teng, Li-Feng; Li, Fu-Hai; Fuh, Chur-Shyang; Shieh, Han-Ping D.; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
1-十月-2015Characterization of the charge trapping properties in p-channel silicon-oxide-nitride-oxide-silicon memory devices including SiO2/Si3N4 interfacial transition layerChiu, Yung-Yueh; Yang, Bo-Jun; Li, Fu-Hai; Chang, Ru-Wei; Sun, Wein-Town; Lo, Chun-Yuan; Hsu, Chia-Jung; Kuo, Chao-Wei; Shirota, Riichiro; 資訊工程學系; Department of Computer Science
2011Electrical performance and photo-responses enhancement by in situ nitrogen incorporation to amorphous InGaZnO thin-film transistorsTeng, Li-Feng; Liu, Po-Tsun; Fuh, Chur-Shyang; Chou, Yi-Teh; Li, Fu-Hai; Chang, Chih-Hsiang; Shieh, Han-Ping D.; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
1-七月-2013Impact of Source/Drain Junction and Cell Shape on Random Telegraph Noise in NAND Flash MemoryLi, Fu-Hai; Shirota, Riichiro; 傳播研究所; 電機資訊學士班; Institute of Communication Studies; Undergraduate Honors Program of Electrical Engineering and Computer Science
1-十月-2012A New Programming Scheme for the Improvement of Program Disturb Characteristics in Scaled NAND Flash MemoryShirota, Riichiro; Huang, Chen-Hao; Nagai, Shinji; Sakamoto, Yoshinori; Li, Fu-Hai; Mitiukhina, Nina; Arakawa, Hideki; 電信工程研究所; Institute of Communications Engineering
31-一月-2011Nitrogenated amorphous InGaZnO thin film transistorLiu, Po-Tsun; Chou, Yi-Teh; Teng, Li-Feng; Li, Fu-Hai; Shieh, Han-Ping; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-四月-2013Study Trapped Charge Distribution in P-Channel Silicon-Oxide-Nitride-Oxide-Silicon Memory Device Using Dynamic Programming SchemeLi, Fu-Hai; Chiu, Yung-Yueh; Lee, Yen-Hui; Chang, Ru-Wei; Yang, Bo-Jun; Sun, Wein-Town; Lee, Eric; Kuo, Chao-Wei; Shirota, Riichiro; 傳播研究所; 電機資訊學士班; Institute of Communication Studies; Undergraduate Honors Program of Electrical Engineering and Computer Science
2009新穎式透明非晶態氧化銦鎵鋅薄膜電晶體穩定性之研究李富海; Li, Fu-Hai; 劉柏村; Liu, Po-Tsun; 光電工程學系
2012非揮發性快閃記憶體元件電荷分佈與可靠度之探討李富海; Li, Fu-Hai; 白田理一郎; Shirota, Riichiro; 電信工程研究所
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