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顯示 1 到 11 筆資料，總共 11 筆
公開日期標題作者
1-四月-2010Benefit of NMOS by Compressive SiN as Stress Memorization Technique and Its MechanismLiao, Chia-Chun; Chiang, Tsung-Yu; Lin, Min-Chen; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-八月-2010Characteristics of SONOS-Type Flash Memory With In Situ Embedded Silicon NanocrystalsChiang, Tsung-Yu; Wu, Yi-Hong; Ma, William Cheng-Yu; Kuo, Po-Yi; Wang, Kuan-Ti; Liao, Chia-Chun; Yeh, Chi-Ruei; Yang, Wen-Luh; Chao, Tien-Sheng; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-十一月-2011Effects of Channel Width and Nitride Passivation Layer on Electrical Characteristics of Polysilicon Thin-Film TransistorsLiao, Chia-Chun; Lin, Min-Chen; Chiang, Tsung-Yu; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-六月-2012Hydrogen Instability Induced by Postannealing on Poly-Si TFTsLiao, Chia-Chun; Lin, Min-Chen; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
2011Impact of Strain Layer on Gate Leakage and Interface-State for nMOSFETs Fabricated by Stress-Memorization TechniqueLiao, Chia-Chun; Lin, Min-Chen; Chiang, Tsung-Yu; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-二月-2012Impacts of the Underlying Insulating Layers on the MILC Growth Length and Electrical CharacteristicsLiao, Chia-Chun; Lin, Min-Chen; Liu, Shao-Xuan; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-九月-2009MILC-TFT With High-kappa Dielectrics for One-Time-Programmable Memory ApplicationChiang, Tsung-Yu; Ma, Ming-Wen; Wu, Yi-Hong; Kuo, Po-Yi; Wang, Kuan-Ti; Liao, Chia-Chun; Yeh, Chi-Ruei; Chao, Tien-Sheng; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-六月-2012Novel 2-Bit/Cell Wrapped-Select-Gate SONOS TFT Memory Using Source-Side Injection for NOR-Type Flash ArrayWang, Kuan-Ti; Hsueh, Fang-Chang; Lu, Yu-Lun; Chiang, Tsung-Yu; Wu, Yi-Hong; Liao, Chia-Chun; Yen, Li-Chen; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-十一月-2009Physical Mechanism of High-Programming-Efficiency Dynamic-Threshold Source-Side Injection in Wrapped-Select-Gate SONOS for NOR-Type Flash MemoryWang, Kuan-Ti; Chao, Tien-Sheng; Chiang, Tsung-Yu; Wu, Woei-Cherng; Kuo, Po-Yi; Wu, Yi-Hong; Lu, Yu-Lun; Liao, Chia-Chun; Yang, Wen-Luh; Lee, Chien-Hsing; Hsieh, Tsung-Min; Liou, Jhyy-Cheng; Wang, Shen-De; Chen, Tzu-Ping; Chen, Chien-Hung; Lin, Chih-Hung; Chen, Hwi-Huang; 電子物理學系; Department of Electrophysics
1-八月-2012Reliability Analysis of Symmetric Vertical-Channel Nickel-Salicided Poly-Si Thin-Film TransistorsWu, Yi-Hong; Lin, Je-Wei; Lu, Yi-Hsien; Kuo, Rou-Han; Yen, Li-Chen; Chen, Yi-Hsuan; Liao, Chia-Chun; Kuo, Po-Yi; Chao, Tien-Sheng; 交大名義發表; National Chiao Tung University
2011氮化矽的氫與其應力對電晶體之影響廖家駿; Liao, Chia-Chun; 趙天生; Chao, Tien-Sheng; 電子物理系所
顯示 1 到 11 筆資料，總共 11 筆