瀏覽 的方式： 作者 Liao, Jih-Chien
顯示 1 到 1 筆資料，總共 1 筆
| 公開日期 | 標題 | 作者 |
| 1-六月-2017 | Fast-IV Measurement Investigation of the Role of TiN Gate Nitrogen Concentration on Bulk Traps in HfO2 Layer in p-MOSFETs | Lu, Ying-Hsin; Chang, Ting-Chang; Liao, Jih-Chien; Chen, Li-Hui; Lin, Yu-Shan; Chen, Ching-En; Liu, Kuan-Ju; Liu, Xi-Wen; Lin, Chien-Yu; Lien, Chen-Hsin; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Yen, Wei-Ting; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
