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公開日期標題作者
30-九月-2020Abnormal hysteresis formation in hump region after positive gate bias stress in low-temperature poly-silicon thin film transistorsTu, Hong-Yi; Chang, Ting-Chang; Tsao, Yu-Ching; Tai, Mao-Chou; Tsai, Yu-Lin; Huang, Shin-Ping; Zheng, Yu-Zhe; Wang, Yu-Xuan; Lin, Chih-Chih; Kuo, Chuan-Wei; Tsai, Tsung-Ming; Wu, Chia-Chuan; Chien, Ya-Ting; Huang, Hui-Chun; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
18-九月-2019Effect of a-InGaZnO TFT Channel Thickness under Self-Heating StressTai, Mao-Chou; Chang, Po-Wen; Chang, Ting-Chang; Tsao, Yu-Ching; Tsai, Yu-Lin; Tu, Hong-Yi; Wang, Yu-Xuan; Chen, Jian-Jie; Lin, Chih-Chih; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2020Interface Defect Shielding of Electron Trapping in a-InGaZnO Thin Film TransistorsLin, Chih-Chih; Tai, Mao-Chou; Chang, Ting-Chang; Tsao, Yu-Ching; Wang, Yu-Xuan; Tsai, Yu-Lin; Tu, Hong-Yi; Lu, I-Nien; Tsai, Tsung-Ming; Huang, Jen-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2020A Novel Structure to Reduce Degradation Under Mechanical Bending in Foldable Low Temperature Polysilicon TFTs Fabricated on PolyimideWang, Yu-Xuan; Chang, Ting-Chang; Huang, Shin-Ping; Tai, Mao-Chou; Zheng, Yu-Zhe; Wu, Chia-Chuan; Shih, Yu-Shan; Chen, Yu-An; Tsai, Yu-Lin; Tu, Hong-Yi; Lu, I-Nien; Zhou, Kuan-Ju; Lin, Chih-Chih; Chu, Ann-Kuo; Sze, Simon; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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