國立陽明交通大學機構典藏：瀏覽交通大學機構典藏

瀏覽的方式：作者 Lin, HN

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公開日期	標題	作者
2005	Channel backscattering characteristics of strained PMOSFETs with embedded SiGe source/drain	Lin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2005	Channel backscattering characteristics of uniaxially strained nanoscale CMOSFETs	Lin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2003	High-performance P-channel Schottky-barrier SOI FinFET featuring self-aligned PtSi source/drain and electrical junctions	Lin, HC; Wang, MF; Hou, FJ; Lin, HN; Lu, CY; Liu, JT; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005	The impact of uniaxial strain engineering on channel backscattering in nanoscale MOSFETs	Lin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; Tang, DD; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2000	Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt film	Lin, HN; Chang, CR; Chiou, YH; 電子物理學系; Department of Electrophysics
1-五月-1998	Magnetic force microscopy study of domain walls on a thin cobalt film	Lin, HN; Chiou, YH; Chen, BM; Shieh, HPD; Chang, CR; 電子物理學系; 光電工程學系; Department of Electrophysics; Department of Photonics
7-四月-2001	Nanoscale surface electrical properties of indium-tin-oxide films for organic light emitting diodes investigated by conducting atomic force microscopy	Lin, HN; Chen, SH; Perng, GY; Chen, SA; 電子物理學系; Department of Electrophysics
1-十月-2000	Surface roughness measurement on microchannels by atomic force microscopy using a bent tapered fiber probe	Chen, SH; Lin, HN; Yang, CR; 電子物理學系; Department of Electrophysics

顯示 1 到 8 筆資料，總共 8 筆