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顯示 1 到 12 筆資料，總共 12 筆
公開日期標題作者
1-二月-2008Analysis of negative bias temperature instability in body-tied low-temperature polycrystalline silicon thin-film transistorsChen, Chih-Yang; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Bias temperature instabilities for low-temperature polycrystalline silicon complementary thin-film transistorsChen, Chih-Yang; Lee, Jam-Wem; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
17-七月-2017Characterization of nitride hole lateral transport in a charge trap flash memory by using a random telegraph signal methodLiu, Yu-Heng; Jiang, Cheng-Min; Lin, Hsiao-Yi; Wang, Tahui; Tsai, Wen-Jer; Lu, Tao-Cheng; Chen, Kuang-Chao; Lu, Chih-Yuan; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
2007Dynamic negative bias temperature instability in low-temperature poly-Si thin-film transistorsChen, Chih-Yang; Wang, Tong-Yi; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2011High-Performance Poly-Si TFTs of Top-Gate with High-kappa Metal-Gate Combine the Laser Annealed Channel and Glass SubstrateLu, Yi-Hsien; Chien, Chao-Hsin; Kuo, Po-Yi; Yang, Ming-Jui; Lin, Hsiao-Yi; Chao, Tien-Sheng; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-十一月-2006Plasma damage-enhanced negative bias temperature instability in low-temperature polycrystalline silicon thin-film transistorsChen, Chih-Yang; Lee, Jam-Wem; Chen, Wei-g Chen; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Po-Hao; Wang, Shen-De; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Plasma-induced damage on the performance and reliability of low-temperature polycrystalline silicon thin-film transistorsChen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wem; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006Process induced instability and reliability issues in low temperature poly-Si thin film transistorsChen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wen; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2007A reliability model for low-temperature polycrystalline silicon thin-film transistorsChen, Chih-Yang; Lee, Jam-Wem; Lee, Po-Hao; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Ma, Ming-Wen; Wang, Shen-De; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1996低溫製造高性能複晶矽薄膜電晶體林孝義; Lin, Hsiao-Yi; 張俊彥, 雷添福; Chun-Yen Chang, Tan Fu Lei; 電子研究所
2009探討一人牙醫診所、聯合牙醫診所與連鎖牙醫診所的經營模式利弊-以S牙醫診所為例林孝怡; Lin, Hsiao-Yi; 陳安斌; Chen, An-Pin; 高階主管管理碩士學程
2017氮化矽快閃記憶體中資料儲存模式 對內部電荷橫向傳輸之影響林曉宜; 汪大暉; Lin, Hsiao-Yi; Tahui Wang; 電子研究所
顯示 1 到 12 筆資料，總共 12 筆