瀏覽 的方式: 作者 Liu, Hsi-Wen

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公開日期標題作者
2016Abnormal Transconductance Enhancement under Positive Bias Stress in Nanoscale n-Channel Fin Field-Effect-TransistorsLiu, Kuan-Ju; Chang, Ting-Chang; Lin, Chien-Yu; Chen, Ching-En; Tsai, Jyun-Yu; Lu, Ying-Hsin; Liu, Hsi-Wen; Cheng, Osbert; Huang, Cheng-Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
31-十二月-2017Analysis of abnormal transconductance in body-tied partially-depleted silicon-on-insulator n-MOSFETsLin, Chien-Yu; Chang, Ting-Chang; Liu, Kuan-Ju; Chen, Li-Hui; Chen, Ching-En; Tsai, Jyun-Yu; Liu, Hsi-Wen; Lu, Ying-Hsin; Liao, Jin-Chien; Ciou, Fong-Min; Lin, Yu-Shan; 電機學院; College of Electrical and Computer Engineering
1-六月-2017Analysis of Contrasting Degradation Behaviors in Channel and Drift Regions Under Hot Carrier Stress in PDSOI LD N-Channel MOSFETsLin, Chien-Yu; Chang, Ting-Chang; Liu, Kuan-Ju; Chen, Li-Hui; Tsai, Jyun-Yu; Chen, Ching-En; Lu, Ying-Hsin; Liu, Hsi-Wen; Liao, Jin-Chien; Chang, Kuan-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2018Combined Effects of Light Illumination and Various Bottom Gate Length on the Instability of Via-Contact-Type Amorphous InGaZnO Thin-Film TransistorsYang, Chung-I; Chang, Ting-Chang; Liao, Po-Yung; Chen, Bo-Wei; Chou, Wu-Ching; Chen, Guan-Fu; Huang, Shin-Ping; Zheng, Yu-Zhe; Wang, Yu-Xuan; Liu, Hsi-Wen; Lin, Chien-Yu; Lin, Yu-Shan; Lu, Ying-Hsin; Zhang, Shengdong; 電子物理學系; Department of Electrophysics
1-十二月-2016Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETsLin, Chien-Yu; Chang, Ting-Chang; Liu, Kuan-Ju; Tsai, Jyun-Yu; Chen, Ching-En; Liu, Hsi-Wen; Lu, Ying-Hsin; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
25-四月-2016Trap state passivation improved hot-carrier instability by zirconium-doping in hafnium oxide in a nanoscale n-metal-oxide semiconductor-field effect transistors with high-k/metal gateLiu, Hsi-Wen; Chang, Ting-Chang; Tsai, Jyun-Yu; Chen, Ching-En; Liu, Kuan-Ju; Lu, Ying-Hsin; Lin, Chien-Yu; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Ye, Yi-Han; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics