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顯示 1 到 6 筆資料，總共 6 筆
公開日期標題作者
1-十一月-2019Abnormal C-V Hump Effect Induced by Hot Carriers in Gate Length-Dependent p-Type LTPS TFTsHuang, Shin-Ping; Chen, Po-Hsun; Tsao, Yu-Ching; Chen, Hong-Chih; Zheng, Yu-Zhe; Chu, Ann-Kuo; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Shih, Yao-Kai; Chung, Yu-Hua; Chen, Wei-Han; Wang, Terry Tai-Jui; Zhang, Sheng-Dong; Chang, Ting-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2020Effect of ELA Energy Density on Self-Heating Stress in Low-Temperature Polycrystalline Silicon Thin-Film TransistorsHuang, Shin-Ping; Chen, Hong-Chih; Chen, Po-Hsun; Zheng, Yu-Zhe; Chu, Ann-Kuo; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Chen, Yu-An; Sun, Pei-Jun; Huang, Hui-Chun; Lai, Wei-Chih; Chang, Ting-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2020Enhancement of Mechanical Bending Stress Endurance Using an Organic Trench Structure in Foldable Polycrystalline Silicon TFTsZheng, Yu-Zhe; Huang, Shin-Ping; Chen, Po-Hsun; Chang, Ting-Chang; Tsai, Tsung-Ming; Chu, Ann-Kuo; Hung, Yang-Hao; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Tu, Yu-Fa; Chen, Yu-An; Sun, Pei-Jun; Chung, Yu-Hua; Chen, Wei-Han; Wang, Tai-Jui; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2019Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film TransistorsHuang, Shin-Ping; Chen, Po-Hsun; Chen, Hong-Chih; Zheng, Yu-Zhe; Chu, Ann-Kuo; Tsao, Yu-Ching; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Lai, Wei-Chih; Chang, Ting-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2019Improving Reliability of High-Performance Ultraviolet Sensor in a-InGaZnO Thin-Film TransistorsTsai, Yu-Lin; Chien, Yu-Chieh; Chang, Ting-Chang; Tsao, Yu-Ching; Tai, Mao-Chou; Tu, Hong-Yi; Chen, Jian-Jie; Wang, Yu-Xuan; Zhou, Kuan-Ju; Shih, Yu-Shan; Lu, I-Nien; Huang, Hui-Chun; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2020A Novel Structure to Reduce Degradation Under Mechanical Bending in Foldable Low Temperature Polysilicon TFTs Fabricated on PolyimideWang, Yu-Xuan; Chang, Ting-Chang; Huang, Shin-Ping; Tai, Mao-Chou; Zheng, Yu-Zhe; Wu, Chia-Chuan; Shih, Yu-Shan; Chen, Yu-An; Tsai, Yu-Lin; Tu, Hong-Yi; Lu, I-Nien; Zhou, Kuan-Ju; Lin, Chih-Chih; Chu, Ann-Kuo; Sze, Simon; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 1 到 6 筆資料，總共 6 筆