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公開日期標題作者
1-二月-2008Characteristics of PBTI and hot carrier stress for LTPS-TFT with high-kappa gate dielectricMa, Ming-Wen; Chen, Chih-Yang; Su, Chun-Jung; Wu, Woei-Cherng; Wu, Yi-Hong; Kao, Kuo-Hsing; Chao, Tien-Sheng; Lei, Tan-Fu; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-十一月-2012Characterizations of polycrystalline silicon nanowire thin-film transistors enhanced by metal-induced lateral crystallizationSu, Chun-Jung; Huang, Yu-Feng; Lin, Horng-Chih; Huang, Tiao-Yuan; 電子工程學系及電子研究所; 奈米中心; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center
1-十一月-2010Effect of Ni residues on the performance and the uniformity of nickel-induced lateral crystallization polycrystalline silicon nanowire thin-film transistorsWang, Bau-Ming; Yang, Tzu-Ming; Wu, YewChung Sermon; Su, Chun-Jung; Lin, Horng-Chih; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
1-十一月-2010Effect of Ni residues on the performance and the uniformity of nickel-induced lateral crystallization polycrystalline silicon nanowire thin-film transistorsWang, Bau-Ming; Yang, Tzu-Ming; Wu, YewChung Sermon; Su, Chun-Jung; Lin, Horng-Chih; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
1-二月-2019Effective N-methyl-2-pyrrolidone wet cleaning for fabricating high-performance monolayer MoS2 transistorsChen, Po-Chun; Lin, Chih-Pin; Hong, Chuan-Jie; Yang, Chih-Hao; Lin, Yun-Yan; Li, Ming-Yang; Li, Lain-Jong; Yu, Tung-Yuan; Su, Chun-Jung; Li, Kai-Shin; Zhong, Yuan-Liang; Hou, Tuo-Hung; Lan, Yann-Wen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2019Effects of Annealing on Ferroelectric Hafnium-Zirconium-Oxide-Based Transistor TechnologyChen, Yi-Hsuan; Su, Chun-Jung; Hu, Chenming; Wu, Tian-Li; 國際半導體學院; International College of Semiconductor Technology
1-一月-2020Effects of Forming Gas Annealing and Channel Dimensions on the Electrical Characteristics of FeFETs and CMOS InverterSung, Po-Jung; Su, Chun-Jung; Lo, Shih-Hsuan; Hsueh, Fu-Kuo; Lu, Darsen D.; Lee, Yao-Jen; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-十月-2006Fabrication and characterization of nanowire transistors with solid-phase crystallized poly-Si channelsLin, Horng-Chih; Lee, Ming-Hsien; Su, Chun-Jung; Shen, Shih-Wen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Fabrication and characterization of poly-Si nanowire devices with performance enhancement techniquesSu, Chun-Jung; Lin, Homg-Chih; Tsai, Hsien-Hung; Huang, Tiao-Yuan; Ni, Wei-Xin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2020Fabrication of Vertically Stacked Nanosheet Junctionless Field-Effect Transistors and Applications for the CMOS and CFET InvertersSung, Po-Jung; Chang, Shu-Wei; Kao, Kuo-Hsing; Wu, Chien-Ting; Su, Chun-Jung; Cho, Ta-Chun; Hsueh, Fu-Kuo; Lee, Wen-Hsi; Lee, Yao-Jen; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics
1-四月-2011Gate-All-Around Junctionless Transistors With Heavily Doped Polysilicon Nanowire ChannelsSu, Chun-Jung; Tsai, Tzu-I; Liou, Yu-Ling; Lin, Zer-Ming; Lin, Horng-Chih; Chao, Tien-Sheng; 電子物理學系; 電子工程學系及電子研究所; 奈米中心; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center
1-六月-2008High-performance metal-induced laterally crystallized polycrystalline silicon p-channel thin-film transistor with TaN/HfO2 gate stack structureMa, Ming-Wen; Chao, Tien-Sheng; Su, Chun-Jung; Wu, Woei-Cherng; Kao, Kuo-Hsing; Lei, Tan-Fu; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-三月-2007High-performance poly-Si nanowire NMOS transistorsLin, Horng-Chih; Su, Chun-Jung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2020Impact of the polarization on time-dependent dielectric breakdown in ferroelectric Hf0.5Zr0.5O2 on Ge substratesYang, Ting-Hsin; Su, Chun-Jung; Wang, Yu-Shun; Kao, Kuo-Hsing; Lee, Yao-Jen; Wu, Tian-Li; 國際半導體學院; International College of Semiconductor Technology
1-二月-2008Impacts of fluorine ion implantation with low-temperature solid-phase crystallized activation on high-kappa LTPS-TFTMa, Ming-Wen; Chen, Chih-Yang; Su, Chun-Jung; Wu, Woei-Cherng; Wu, Yi-Hong; Yang, Tsung-Yu; Kao, Kuo-Hsing; Chao, Tien-Sheng; Lei, Tan-Fu; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-三月-2011Impacts of Multiple-Gated Configuration on the Characteristics of Poly-Si Nanowire SONOS DevicesHsu, Hsing-Hui; Lin, Horng-Chih; Luo, Cheng-Wei; Su, Chun-Jung; Huang, Tiao-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Impacts of nitric acid oxidation on low-temperature polycrystalline silicon TFTs with high-k gate dielectricYang, Tsung-Yu; Ma, Ming-Wen; Kao, Kuo-Hsing; Su, Chun-Jung; Chao, Tien-Sheng; Lei, Tan-Fu; 電子物理學系; Department of Electrophysics
2010Improved Performance of NILC Poly-Si Nanowire TFTs by Using Ni-GetteringWang, Bau-Ming; Yang, Tzu-Ming; Wu, YewChung Sermon; Su, Chun-Jung; Lin, Horng-Chih; 材料科學與工程學系; Department of Materials Science and Engineering
1-四月-2020Improved TDDB Reliability and Interface States in 5-nm Hf0.5Zr0.5O2 Ferroelectric Technologies Using NH3 Plasma and Microwave AnnealingChen, Yi-Hsuan; Su, Chun-Jung; Yang, Ting-Hsin; Hu, Chenming; Wu, Tian-Li; 國際半導體學院; International College of Semiconductor Technology
1-三月-2008Improvement on performance and reliability of TaN/HfO2 LTPS-TFTs with fluorine implantationMa, Ming-Wen; Chen, Chih-Yang; Su, Chun-Jung; Wu, Woei-Cherng; Yang, Tsung-Yu; Kao, Kuo-Hsing; Chao, Tien-Sheng; Lei, Tan-Fu; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
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