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公開日期標題作者
1-一月-2006Analyzing type II censored data obtained from repetitious experimentsTong, LI; Yang, CH; 工業工程與管理學系; Department of Industrial Engineering and Management
2003Bootstrap confidence interval of the difference between two process capability indicesChen, JP; Tong, LI; 工業工程與管理學系; Department of Industrial Engineering and Management
16-七月-2004Dynamic multiple responses by ideal solution analysisTong, LI; Wang, CH; Chen, CC; Chen, CT; 工業工程與管理學系; Department of Industrial Engineering and Management
1-二月-2006Incorporating process capability index and quality loss function into analyzing the process capability for qualitative dataHsieh, KL; Tong, LI; 工業工程與管理學系; Department of Industrial Engineering and Management
2005An innovative model of multi-project wafer service in the foundry industryYang, TY; Tong, LI; Yuan, BJC; 工業工程與管理學系; 科技管理研究所; Department of Industrial Engineering and Management; Institute of Management of Technology
1-三月-2006Manufacturing performance evaluation for IC productsHsieh, KL; Tong, LI; 工業工程與管理學系; Department of Industrial Engineering and Management
1997Modified process control chart in IC fabrication using clustering analysisTong, LI; Lee, WI; 工業工程與管理學系; Department of Industrial Engineering and Management
1-二月-2005Monitoring defects in IC fabrication using a hotelling T-2 control chartTong, LI; Wang, CH; Huang, CL; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十二月-2002Multi-response optimization using principal component analysis and grey relational analysisTong, LI; Wang, CH; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十二月-1997Multi-response robust design by principal component analysisSu, CT; Tong, LI; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十二月-1997A neural network-based procedure for the process monitoring of clustered defects in integrated circuit fabricationSu, CT; Tong, LI; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十二月-1997A neural network-based procedure for the process monitoring of clustered defects in integrated circuit fabricationSu, CT; Tong, LI; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十二月-2005Optimization of a multi-response problem in Taguchi's dynamic systemHsieh, KL; Tong, LI; Chiu, HP; Yeh, HY; 工業工程與管理學系; Department of Industrial Engineering and Management
1-八月-2001Optimization of multiple quality responses involving qualitative and quantitative characteristics in IC manufacturing using neural networksHsieh, KL; Tong, LI; 工業工程與管理學系; Department of Industrial Engineering and Management
1-十二月-2005Optimization of multiple responses using principal component analysis and technique for order preference by similarity to ideal solutionTong, LI; Wang, CH; Chen, HC; 工業工程與管理學系; Department of Industrial Engineering and Management
1-一月-1997Optimizing multi-response problems in the Taguchi method by fuzzy multiple attribute decision makingTong, LI; Su, CT; 工業工程與管理學系; Department of Industrial Engineering and Management
1-一月-1997Optimizing multi-response problems in the Taguchi method by fuzzy multiple attribute decision makingTong, LI; Su, CT; 交大名義發表; 工業工程與管理學系; National Chiao Tung University; Department of Industrial Engineering and Management
1-二月-2006Optimizing processes based on censored data obtained in repetitious experiments using grey predictionTong, LI; Wang, CH; Hsiao, LC; 工業工程與管理學系; Department of Industrial Engineering and Management
2002Performance assessment of processing and delivery times for very large scale integration using process capability indicesChen, KS; Chen, HT; Tong, LI; 工業工程與管理學系; Department of Industrial Engineering and Management
2003Quality improvement for dynamic ordered categorical response using grey relational analysisWang, CH; Tong, LI; 工業工程與管理學系; Department of Industrial Engineering and Management
顯示 1 到 20 筆資料，總共 20 筆