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公開日期標題作者
2006Insight of stress effect on the ONO stack layer in a SONOS-type flash memory cellYeh, C. C.; Liao, Y. Y.; Wang, Tahui; Tsai, W. J.; Lu, T. C.; Kao, H. L.; Ou, T. F.; Chen, M. S.; Chen, Y. K.; Lai, E. K.; Shih, Y. H.; Ting, WenChi; Ku, Y. H. Joseph; Lit, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006Investigation of charge loss in cycled NBit cells via field and temperature accelerationsTsai, W. J.; Zous, N. K.; Chen, H. Y.; Liu, Lenvis; Yeh, C. C.; Chen, Sam; Lu, W. P.; Wang, Tahui; Ku, Joseph; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2018Investigation of Data Pattern Effects on Nitride Charge Lateral Migration in a Charge Trap Flash Memory by Using a Random Telegraph Signal MethodLiu, Y. H.; Lin, H. Y.; Jiang, C. M.; Wang, Tahui; Tsai, W. J.; Lu, T. C.; Chen, K. C.; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
八月-2016Poly-Silicon Trap Position and Pass Voltage Effects on RTN Amplitude in a Vertical NAND Flash Cell StringChou, Y. L.; Wang, Tahui; Lin, Mercator; Chang, Y. W.; Liu, Lenvis; Huang, S. W.; Tsai, W. J.; Lu, T. C.; Chen, K. C.; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2011多媒體播放系統之設計與實作劉超仁; Liu, Chao-Jen; 蔡文錦; Tsai, W. J.; 資訊學院資訊學程
顯示 1 到 5 筆資料，總共 5 筆