瀏覽 的方式： 作者 Tseng, Huan-Chi
顯示 1 到 4 筆資料，總共 4 筆
| 公開日期 | 標題 | 作者 |
| 1-五月-2014 | Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process Characterization | Luo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-五月-2014 | Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process Characterization | Luo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-五月-2011 | A Novel Array-Based Test Methodology for Local Process Variation Monitoring | Luo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael Shien-Yang; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Fisher, Philip A.; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2009 | A novel array-based test methodology for local process variation monitoring | Luo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael S. -Y.; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
